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Informasi Alat
| Nama Alat | Atomic Force Microscope |
|---|---|
| Deskripsi Alat | Karakterisasi Nano Material Specification : The autonomous atomic force microscope The first dual-camera system ever adopted in research AFM Machine learning automation with updateble data Auto probe identification and Exchange Most accurate scan system by crosstalk elimination The fastest, most accurate, true Non-ccontact mode Simplicity from start to scan with 3 simple clicks Easy sample navigation Environmental sensors for self-diagnostics auto set-up for imaging Technical Specification: - XY scan range: 100 μm x 100 μm - Position detection noise level: < 0.4 nm; resolution: 0.1 nm - Z scan range: 15 μm x 15 μm - heigh noise : < 0.03 nm; resolution: 0.015 nm - Vision path: on-axis sample view from top - LCCD: 5.1 M Pixel - sample size: 20 mm x 20 mm; Mounting: Magnetic holder (max. 4 sampler disc) - AFM controller Lock0in amp: 4 channel integrated 16 Hz - 5 MHz System Include : 100 μm XY Scanner Standard AFM Head with Decoupled Flexure-Guided Z Scanner Direct On-Axis Motorized Optics stage with CCD and LED Illumination Multi Snap-in Chuck Motorized XY Stage Motorized Z Stage Motorized Focus Stage for On-Axis Optics Automatic Probe Exchange Park AFM Controller (PAC) UPS 3 KVA Stand-alone Acoustic Enclosure for FX40 active Vibration Isolation Computer with Dual Monitors (inc. OS Windows & Office) Software system: operating & Image Analysis Software |
| Preparasi Sample | |
| Lokasi | Lab Kimia Terpadu Jatinangor |
| PIC | Idan Rostaman |
| Status | Active : Penggunaan Alat dapat dilakukan oleh semua users. |
| Waktu Penggunaan Alat | Per-jam |
